LXRD®

The Ultimate Audit Station for Residual Stress and Retained Austenite Measurement

axrd benchtop powder brochure

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Our laboratory and industrial testing residual stress XRD powerhouse, the LXRD system is designed for heavy-duty, around-the-clock operation. Extremely fast, accurate, and reliable, the LXRD offers the highest return on investment in the industry. Measurements can be performed in as little as a minute.

The LXRD is available with standard or oversized enclosures for large part capacity. Flexible instrument options and available residual stress mapping make the LXRD a proven leader in high-powered residual stress and retained austenite measurement systems.

LXRD microarea
Standard
Widebody
Modular Mapping
Gantry
Microarea
LXRD standard

LXRD Standard

LXRD measuring a crankshaft

Our high-performing LXRD Standard small enclosure system, designed with compactness in mind, can fit through a single door. This system is perfect for measuring smaller parts and samples up to 30 cm.

This state-of-the-art instrument is available in a cost-effective bare enclosure configuration or upgraded with numerous options, including a manual XY-positioning stage, phi rotation stage (automated triaxial measurement), fully automated 300x200-mm-travel XY residual stress mapping stage, and % retained austenite measurement capabilities. The radiation-proof enclosure, automated 400 mm z-axis, MG2000 1200 W high-power goniometer, fully integrated chiller, and levelling pads with wheels provide performance and flexibility in a compact package.

LXRD widebody doors open

LXRD Widebody

The LXRD Widebody has all the features of the standard model but comes with an increased enclosure capacity for measuring parts up to 50 cm. With a 500-mm Z axis and an increased travel of 300 mm for the Y stage, the Widebody provides one of the largest measurement envelopes of a stand-alone cabinet system.

LXRD widebodyLXRD widebody full view
LXRD modular mapping

LXRD Modular Mapping

The LXRD Modular Mapping system introduces high-powered residual stress mapping to large components. Oversized parts composed of materials that are difficult to measure, such as titanium, are no longer restricted to low-power portable systems. With over 2 meters of measurement space, heavy-duty XY-mapping stages, and a removable mapping stage, the Modular Mapping system has the flexibility to meet all of your complex experimental needs.

LXRD modular mapping table openLXRD modular mapping table closed
LXRD gantry

LXRD Gantry

The LXRD Gantry system is Proto’s largest enclosure system. With a 3.5-meter walk-in enclosure and long-travel overhead XYZ slides, the LXRD Gantry simplifies measurement of large, heavy components by moving the goniometer instead of the sample. Outfitted with a GR2000 goniometer, this instrument provides the flexibility of built-in phi rotation for triaxial measurements.

LXRD gantry headLXRD gantry full view
LXRD microarea

LXRD Microarea

The LXRD Microarea is Proto’s full-featured research-grade instrument for residual stress measurement. A secondary chi rotation stage enables measurement in true side inclination (in addition to omega and modified side inclination). The XY-mapping stage, phi rotation stage, video microscope, and x-ray beam aperture sizes (as low as 30 microns) provide advanced tools for your microarea residual stress measurement needs.

LXRD microarea cameraLXRD microarea measuringLXRD microarea close up

STAGES

XY Phi Mapping

X, Y, Phi
mapping Table

Map stresses across your sample and obtain fully automated stress measurements in different directions.

XY Positioning Stage

XY positioning
stages

Quickly and conveniently position your sample to access measurement locations on a part.

Triaxial Rotation stage

triaxial phi
rotation stage

Automated rotation of your part to easily obtain stress information in multiple directions.

x-ray beam apertures

aperture kit

Standard apertures

Circular and rectangular apertures to ensure the optimal sampling shape near features such as welds and holes.

microbeam apertures

microbeam apertures

Microbeam apertures from 30 to 150 microns.

focusing systemS

manual focusing

Manual

Enables accurate positioning of the goniometer in complex geometries.

Automated focusing

Automated

Convenient automated focusing and fast focusing of large residual stress maps.

Mapping Solutions

XY Phi Mapping

standard mapping

Mapping solutions for unattended operation.

ball mapping

ball mapping

Unique mapping system to characterize spherical surfaces such as balls.  

Custom mapping systems are available upon request.
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EASY and CONVENIENT TO USE

All of our LXRDs have features that make them easy and convenient to use. The high-performance goniometers maintain ASTM E915 accuracy in low-maintenance designs. The manual focusing pointer enables accurate positioning of the goniometer in complex geometries, while the automated focusing pointer allows convenient focusing of large residual stress maps. A wide variety of x-ray beam apertures are available, including round 0.2, 0.5, 1.0, 2.0, 3.0, and 4.0 mm options and rectangular 0.5x3, 1x3, 0.5x5, 1x5, and 2x5 mm options. High stress standards, zero stress powders, and RA standards ensure accurate results. Integrated cooling makes for self-contained instruments.

goniometer bearing

High-performance goniometer Bearing

Reference standards

Reference standards

cooling systems

Integrated x- ray tube cooling systems

cooling systems

electropolisher

ADVANCED FEATURES

Residual stress mapping is available on all LXRD models, providing a comprehensive picture of the residual stress state of your part. As the originators of residual stress mapping, Proto is a leader in the field. Automated retained austenite (as per ASTM E915) enables characterization of % RA in steels as low as 1%. X-ray elastic constant (XEC) determination ensures automated residual stress measurement material calibration as per ASTM E1426. Pole figures created using the LXRD rotary stages can be used for preferred orientation analysis, single-crystal orientation, and single-crystal stress measurement.

XY Phi Mapping

mapping stages

retained austenite

Automated retained austenite measurement

Pole figure

Pole figure

XEC

XEC determination via
4-point bend