MEASUREMENT SERVICES
Comprehensive Solutions • Specialized Technicians • Advanced Technology • Accurate Results
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Trust your x-ray diffraction measurement needs to our highly skilled and knowledgeable team. With a core focus on residual stress measurement, our accredited laboratories have the highest quality standards and carefully follow all procedures, ensuring accurate data collection. With over 20 dedicated XRD systems, we can accommodate your laboratory and field measurement needs with fast, accurate, and efficient service.
ISO/IEC 17025:2017 Accredited [DOWNLOAD CERTIFICATE]
ITAR Registered • Controlled Goods Registered
LABORATORY LOCATIONS
USA: 12350 Universal Drive, Taylor, MI
Tel: 1-734-946-0974
Canada: 6150 Morton Industrial Parkway, LaSalle, ON
Tel: 1-519-737-6330
Email: xrdlab@protoxrd.com
SOLUTIONS
RESIDUAL STRESS MEASUREMENT
ASTM E915, ASTM E2860, ASTM E1426, SAE HS-784, RS vs. depth, RS mapping
RETAINED AUSTENITE ANALYSIS
ASTM E975, SAE SP-453, Rietveld analysis, carbide evaluation
SINGLE-CRYSTAL ORIENTATION
Determine the orientation of single-crystal materials using Laue XRD
POWDER DIFFRACTION
Phase identification, quantitative phase analysis, nitride layer analysis
CAPABILITIES
Proto’s x-ray diffraction (XRD) measurement services provide characterization solutions for a wide range of applications including shot peening, heat treatment, surface enhancement, grinding, machining, welding, corrosion, and fatigue. Our state-of-the-art laboratories are equipped with specialized instrumentation to ensure reliable and accurate results.
- 11 high-speed laboratory LXRD residual stress and retained austenite measurement systems
- 9 portable iXRD residual stress and retained austenite measurement systems
- 4 AXRD general purpose powder diffractometers
- Laue-HT single-crystal orientation system
- LXRD-SC single-crystal residual stress system
- High-speed hole drilling RS system
- Wet chemistry laboratory for sample prep
- 8818-V3 electropolishers
- Metrology lab with high accuracy profilometers
- Strain gauging