Laue-COS Benchtop

Compact, Convenient Laue Single-Crystal Orientation Measurement for Production and Research Labs

laue COS brochure

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Proto® designed the Laue-COS Benchtop system to offer a compact platform for orienting single-crystal materials such as scintillation crystals, non-linear optics, piezoelectrics, minerals, and substrates. Producing lab-quality data without occupying the space of a typical Laue orientation instrument, the Laue-COS Benchtop is a great option for those with space limitations.

The Laue-COS Benchtop is a self-contained instrument that does not use any consumables (e.g., detector gases), and it enables experiments on versatile samples, geometries, and crystal systems. From small crystals to larger rods, this Laue orientation system provides a compact solution suitable for many laboratory samples.

Superior Image Quality for Accurate Single-Crystal Orientation

The system features a back-reflection scintillation detector that is made in house by Proto. The detector has a resolution of 2080 by 2080 pixels and a pixel size of 61 microns. With low noise and a 127-by-127-mm area, images are produced with incredible quality. Binning capabilities help ensure quick collection times, making Laue orientation as efficient as possible.

Horizontal and Vertical Setups Available

Two different configurations are available depending on your application and preferences: horizontal and vertical.

Laue-COS Diffractometer
Horizontal
vertical
Laue-COS Benchtop horizontal

Laue-COS Benchtop: Horizontal Version

The horizontal Laue-COS Benchtop is a convenient option for general purpose crystal orienting and cutting.

When the system is equipped with Proto's manual goniometer, the user can seamlessly go from x-ray crystal reorientation measurement directly to their cutting machine without removing the sample from the goniometer's mounting platform, allowing them to retain the precise reoriented position of the crystal.

features

  • Manual x,y sample stage with 4" travel per axis
  • Removable sample platform to allow mounting of large crystals
  • Ability to mount manual goniometer or manual crystal-cutting goniometer
  • Optional upgrade to motorized x,y stages (joystick control)
Pipeline stand

Detector

Floor Stand

Aluminum
calibration block

Tripod Stand

manual goniometer

Phi Stand

goniometer for
crystal cutting

Laue-COS Benchtop vertical

Laue-COS Benchtop: Vertical Version

The vertical Laue-COS Benchtop is ideal for quality control of thin plates and wafers, such as diamond plates.

The vertical version of the Laue-COS Benchtop features a laser focusing system for convenient measurement setup. With the laser scanner, subtle wedge shapes can be calculated within thin plate samples, providing a more accurate direction of crystal growth.

sample table options

  • Manual x,y sample stage with 4" travel per axis
  • Optional upgrade to motorized x,y stages (joystick control)
  • 100-mm base plate mounting slide
Pipeline stand

Detector

Floor Stand

laser focusing system

Tripod Stand

Thin plate diamond holder

Phi Stand

Automated motion stages

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Flexibility and Safety

The Laue-COS Benchtop enables the measurement of a wide variety of materials while providing full radiation protection for users. Equipped with a Proto tungsten x-ray tube, the system delivers on quality and performance, as well as convenient warranty/support options.

Customization Options

The diffractometer can be configured in either a horizontal or vertical setup with either a manual or motorized x,y stage for scanning across a crystal face or orientation mapping. When it comes to orienting the crystal for cutting or quickly scanning the crystal to identify reflections, manual goniometers with chi, phi, and omega rotation are available to suit your experimental needs.

For more advanced applications, Proto can create custom saw-cutting adapters that can be utilized in the Laue-COS Benchtop. Finally, Proto’s software package covers both collection and in-depth analysis, including support for all crystal systems and integration with the Crystallography Open Database (COD).

Laue COS measuring

LAUE DIFFRACTION Software
AND Applications

XRDWIN® 2.0 Laue is designed for both operating our single-crystal Laue orientation systems and performing data analysis of Laue patterns. Standard features include a comprehensive set of tools for analyzing patterns, indexing, and reorienting crystals.  This modular program can be easily modified to suit each customer’s workflow requirements.

Features:

  • Laue pattern simulation from space group and crystal data
  • Crystallography Open Database (COD) database integration
  • 001, 011, 111 and custom overlays for manual matching of Laue patterns
  • Stereographic projections
  • Indexing of patterns
YAG single crystal laue patternLaue COS software screen