XRDWIN 2.0 is an extremely powerful yet easy-to-operate x-ray diffraction software package for our lines of XRD instruments. Whether you’re using one of our residual stress systems, Laue orientation systems, or powder diffractometers, you can rely on our dedicated software packages to enhance the capabilities of your system.
XRDWIN 2.0 Software
XRDWIN 2.0 is a comprehensive and convenient software package for our line of XRD instruments. Our package is your one-stop solution for residual stress measurement, retained austenite measurement, pole figures, x-ray elastic constant (XEC) determination, and much more.
As the originators of automated stress mapping, we have spent considerable time developing a comprehensive set of patented stress mapping techniques and software tools.
Features include square, rectangular, and circle grid mapping; individual point selection for custom map trajectories; and patented multi-level 3D graphical representation of results. There is also a multi-map display and map algebra capability.
Mix and Match Maps
Residual stress • Peak width • % Retained austenite • Hardness • Principal stress • Individual stress tensors
Show Before and After Maps
Compare pre- and post-process • Compare new and used • Track life cycle
Perform Map Algebra
+, -, x, /, average • Show net gains/losses
Validate Your Data
Verify FEA models • Evaluate surface enhancements • Determine weld stresses
XRDWIN 2.0 Laue
This specialized version of XRDWIN is designed for both operation of our single-crystal Laue orientation systems and data analysis of Laue patterns. Standard features include a comprehensive set of tools for analyzing patterns, indexing, and reorienting crystals. High-speed production mode simplifies high-throughput orientation of single-crystal components such as turbine blades.
XRDWIN PD
This specialized version of XRDWIN is designed for both operation of our powder diffractometers and data analysis of powder patterns. Choose XRDWIN PD for basic qualitative and quantitative analysis.
For advanced analysis of your diffraction patterns, we offer MDI's JADE 2010 software. This program integrates with XRDWIN PD to provide seamless access to advanced analysis tools such as Rietveld refinement.
